Proceedings of the 43rd annual Design Automation Conference
Worst-case design and margin for embedded SRAM
Proceedings of the conference on Design, automation and test in Europe
Yield-driven near-threshold SRAM design
Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design
Breaking the simulation barrier: SRAM evaluation through norm minimization
Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design
The impact of BEOL lithography effects on the SRAM cell performance and yield
ISQED '09 Proceedings of the 2009 10th International Symposium on Quality of Electronic Design
Variability aware modeling of SoCs: From device variations to manufactured system yield
ISQED '09 Proceedings of the 2009 10th International Symposium on Quality of Electronic Design
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
A holistic approach for statistical SRAM analysis
Proceedings of the 47th Design Automation Conference
On the exploitation of the inherent error resilience of wireless systems under unreliable silicon
Proceedings of the 49th Annual Design Automation Conference
| Hi-index | 0.00 |
This paper presents an automated technique to perform SRAM wide statistical analysis in presence of process variability. The technique is implemented in a prototype tool and is demonstrated on several 45 and 32nm industry-grade SRAM vehicles. Selected case studies show how this approach successfully captures non-trivial statistical interactions between the cells and the periphery, which remain uncovered when only using statistical electrical simulations of the critical path or applying a digital corner approach. The presented tool provides the designer with valuable information on what performance metrics to expect, if manufactured. Since this feedback takes place in the design phase, a significant reduction in development time and cost can be achieved.