Numerical recipes in C (2nd ed.): the art of scientific computing
Numerical recipes in C (2nd ed.): the art of scientific computing
A note on a method for generating points uniformly on n-dimensional spheres
Communications of the ACM
Statistical timing for parametric yield prediction of digital integrated circuits
Proceedings of the 40th annual Design Automation Conference
Handbook of Mathematical Functions, With Formulas, Graphs, and Mathematical Tables,
Handbook of Mathematical Functions, With Formulas, Graphs, and Mathematical Tables,
Proceedings of the 43rd annual Design Automation Conference
A statistical simulation method for reliability analysis of SRAM core-cells
Proceedings of the 47th Design Automation Conference
Efficient SRAM failure rate prediction via Gibbs sampling
Proceedings of the 48th Design Automation Conference
Proceedings of the International Conference on Computer-Aided Design
| Hi-index | 0.00 |
We propose a new yield estimation algorithm which estimates the acceptability region as the union of spherical cones. The algorithm works by dividing the input parameter space into approximately equi-probable cones, efficiently estimating the refined weight contributions for each cone, then combining the results to get the total yield. The algorithm is broadly similar to the worst-case-distances method, but is more generally applicable for cases with -for example- multiple failure regions. The algorithm is quite accurate, and offers several orders (100x) of magnitude of speedup compared to traditional Monte Carlo. The paper includes example applications to difficult high-yield circuits like SRAM.