Multiple Design Error Diagnosis and Correction in Digital VLSI Circuits
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
An automatic interconnection rectification technique for SoC design integration
ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
Diagnosis of transition fault clusters
Proceedings of the 48th Design Automation Conference
| Hi-index | 0.03 |
We consider the problem of correcting errors in a macro-based circuit. Our formulation of the problem allows the correction of errors that arise both in the context of design error correction before the circuit is realized, and when a physical circuit needs to be corrected or diagnosed. Two error classes are defined, namely, component errors and line errors. Both single and multiple errors are considered. Accurate correction procedures are given for single errors. Heuristics are used for correcting multiple errors. Experimental results are given to demonstrate the correction procedures presented