An efficient control variates method for yield estimation of analog circuits based on a local model
Proceedings of the International Conference on Computer-Aided Design
Multidimensional analog test metrics estimation using extreme value theory and statistical blockade
Proceedings of the 50th Annual Design Automation Conference
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The efficiency of several variance reduction techniques (in particular, importance sampling, stratified sampling, and control variates) are studied with respect to their application in estimating circuit yields. This study suggests that one essentially has to have a good approximation of the region of acceptability in order to achieve significant variance reduction. Further, all the methods considered are based, either explicitly or implicity, on the use of a model. The control variate method appears to be more practical for implementation in a general purpose statistical circuit analysis program. Stratified sampling is the most simple to implement, but yields only very modest reductions in the variance of the yield estimator. Lastly, importance sampling is very useful when there are few parameters and the yield is very high or very low; however, a good practical technique for its implementation, in general, has not been found.