An efficient control variates method for yield estimation of analog circuits based on a local model

Authors:
Pierre-Francois Desrumaux;Yoan Dupret;Jens Tingleff;Sean Minehane;Mark Redford;Laurent Latorre;Pascal Nouet
Affiliations:
CSR, Sophia Antipolis, France and LIRMM, Montpellier, France;CSR, Sophia Antipolis, France;CSR, Sophia Antipolis, France;CSR, Cambridge, UK;CSR, Cambridge, UK;LIRMM, Montpellier, France;LIRMM, Montpellier, France
Venue:
Proceedings of the International Conference on Computer-Aided Design
Year:
2012

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Abstract

Statistical analysis of analog circuits usually relies on the standard Monte Carlo method to estimate the yield of a circuit. However, this method is limited by a slow convergence rate which leads to a prohibitive number of simulations to reach a given accuracy. In this paper, we propose to combine the kernel-based distribution estimator with the control variates method in order to obtain an accurate yield estimation with only a few hundred simulations. With respect to the auxiliary variable needed for the control variates method, we propose a quick modeling technique based on local sensitivities.