Write-optimized reliable design of STT MRAM

Authors:
Yusung Kim;Sumeet Kumar Gupta;Sang Phill Park;Georgios Panagopoulos;Kaushik Roy
Affiliations:
Purdue University, West Lafayette, IN, USA;Purdue University, West Lafayette, IN, USA;Purdue University, West Lafayette, IN, USA;Purdue University, West Lafayette, IN, USA;Purdue University, West Lafayette, IN, USA
Venue:
Proceedings of the 2012 ACM/IEEE international symposium on Low power electronics and design
Year:
2012

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Abstract

Spin transfer torque magnetic random access memory (STT MRAM) is a promising non-volatile memory due to its outstanding potential for high integration density and excellent scalability. Despite the attractive features, high write current and power is still a major challenge. As a result, the optimization of the memory for write is critical. In this work, we analyze asymmetric write currents in STT MRAMs considering process variations, and identify a potential for write power reduction. We propose circuit design techniques 1) bit-line voltage clamping using a pass transistor and 2) 2T-1R dual source-line bit-cell design, to balance out the asymmetric write currents and optimize the memory design from both write-power and reliability aspects. Our proposed techniques can be easily incorporated with previously proposed design techniques without affecting the bit-cell write-ability, read stability, and performance. We analyze the impact of our proposed techniques on write power and MTJ current density and show 30-68% average write power savings and 4-41% reduction in MTJ current density in STT MRAM.