Accurate fitting of measured reflectances using a Shifted Gamma micro-facet distribution

  • Authors:
  • M. M. Bagher;C. Soler;N. Holzschuch

  • Affiliations:
  • Maverick, INRIA Grenoble-Rhône-Alpes and LJK (University of Grenoble and CNRS);Maverick, INRIA Grenoble-Rhône-Alpes and LJK (University of Grenoble and CNRS);Maverick, INRIA Grenoble-Rhône-Alpes and LJK (University of Grenoble and CNRS)

  • Venue:
  • Computer Graphics Forum
  • Year:
  • 2012

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Abstract

Material models are essential to the production of photo-realistic images. Measured BRDFs provide accurate representation with complex visual appearance, but have larger storage cost. Analytical BRDFs such as Cook-Torrance provide a compact representation but fail to represent the effects we observe with measured appearance. Accurately fitting an analytical BRDF to measured data remains a challenging problem. In this paper we introduce the SGD micro-facet distribution for Cook-Torrance BRDF. This distribution accurately models the behavior of most materials. As a consequence, we accurately represent all measured BRDFs using a single lobe. Our fitting procedure is stable and robust, and does not require manual tweaking of the parameters. © 2012 Wiley Periodicals, Inc.