Challenges in Embedded Memory Design and Test
Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
A memory grouping method for sharing memory BIST logic
ASP-DAC '06 Proceedings of the 2006 Asia and South Pacific Design Automation Conference
A Hybrid BIST Scheme for Multiple Heterogeneous Embedded Memories
ATS '07 Proceedings of the 16th Asian Test Symposium
A discrete particle swarm optimization algorithm for uncapacitated facility location problem
Journal of Artificial Evolution and Applications - Particle Swarms: The Second Decade
A Low-Cost Pipelined BIST Scheme for Homogeneous RAMs in Multicore Chips
ATS '08 Proceedings of the 2008 17th Asian Test Symposium
BIST design optimization for large-scale embedded memory cores
Proceedings of the 2009 International Conference on Computer-Aided Design
Hi-index | 0.00 |
Network-on-Chip (NoC) based Built-In-Self Test (BIST) architecture is an acceptable solution for testing embedded memory cores in Systems-On-Chip. The reuse of the available on-chip network to act as Test Access Mechnism brings down the area overhead as well as reduces test power. However, reducing the time to test still remains a problem due to latency in transporting the test instruction from BIST circuit to the memory cores. We have proposed a NoC based test architecture where a number of BIST controllers are shared by memory cores. A Particle Swarm Optimization (PSO) based technique is used (i) to place the BIST controllers at fixed locations and (ii) to form clusters of memories sharing the BIST controllers. This reduces the test instruction transport latency which in turn reduces the total test time of memory cores. Experimental results on different sizes of mesh based NoC confirm the effectiveness of our PSO based approach over heuristic techniques reported in literature as well as used in the industry.