An advanced diagnostic method for delay faults in combinational faulty circuits

Efficient diagnosis of path delay faults in digital logic circuits

ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design

On test coverage of path delay faults

VLSID '96 Proceedings of the 9th International Conference on VLSI Design: VLSI in Mobile Communication

Path-Delay Fault Diagnosis in Non-Scan Sequential Circuits with At-Speed Test Application

ITC '00 Proceedings of the 2000 IEEE International Test Conference

A yield improvement methodology using pre- and post-silicon statistical clock scheduling

Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design