Error-rate based biometrics fusion

  • Authors:
  • Kar-Ann Toh

  • Affiliations:
  • Biometrics Engineering Research Center, School of Electrical & Electronic Engineering, Yonsei University, Seoul, Korea

  • Venue:
  • ICB'07 Proceedings of the 2007 international conference on Advances in Biometrics
  • Year:
  • 2007

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Abstract

This paper addresses the face verification problem by fusing visual and infra-red face verification systems. Unlike the conventional least squares error minimization approach which involves fitting of a learning model to data density and then perform a threshold process for error counting, this work directly formulates the required target error count rate in terms of design model parameters. A simple power series model is adopted as the fusion classifier and our experiments show promising results.