Testing High-Speed IO Links Using On-Die Circuitry
VLSID '06 Proceedings of the 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design
Pattern Recognition and Machine Learning (Information Science and Statistics)
Pattern Recognition and Machine Learning (Information Science and Statistics)
Post-silicon validation challenges: how EDA and academia can help
Proceedings of the 47th Design Automation Conference
Proceedings of the 50th Annual Design Automation Conference
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There are increasingly number of analog/mixed-signal circuits in microprocessors and SOCs. A significant portion of mixed-signal circuits are high-speed I/O links, including serial buses such as PCIE and parallel buses such as DDR. Post-silicon validation of I/O links is hard and time-consuming, and can be critical for making a product release qualification decision. In this paper, we try to summarize key challenges in post-silicon I/O validation. We discuss potential research directions and potential solutions to improve efficiency and quality of I/O validation.