Impact of pulse quenching effect on soft error vulnerabilities in combinational circuits based on standard cells

Authors:
Du Yankang;Chen Shuming;Liu Biwei
Affiliations:
School of Computer Science, National University of Defense Technology, Changsha 410073, China;School of Computer Science, National University of Defense Technology, Changsha 410073, China;School of Computer Science, National University of Defense Technology, Changsha 410073, China
Venue:
Microelectronics Journal
Year:
2013

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Abstract

In this study, we investigated the impact of pulse quenching effect on the soft error vulnerabilities in combinational circuits. Simulation results illustrate that soft error vulnerabilities could be reduced by 4-16% for the benchmark circuits when the pulse quenching effect is introduced. By adjusting the cell orientations of the quenching cells in the layout, the soft error vulnerabilities could be further reduced. It is suggested that new placement algorithm considering circuit reliability should be designed to reduce the circuit soft error vulnerabilities.