Statistical modeling with the virtual source MOSFET model

  • Authors:
  • Li Yu;Lan Wei;Dimitri Antoniadis;Ibrahim Elfadel;Duane Boning

  • Affiliations:
  • Massachusetts Institute of Technology;Massachusetts Institute of Technology;Massachusetts Institute of Technology;Masdar Institute of Science and Technology;Massachusetts Institute of Technology

  • Venue:
  • Proceedings of the Conference on Design, Automation and Test in Europe
  • Year:
  • 2013

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Abstract