Predicting future product performance: modeling and evaluation of standard cells in FinFET technologies

Authors:
Veit B. Kleeberger;Helmut Graeb;Ulf Schlichtmann
Affiliations:
Technische Universität München, Munich, Germany;Technische Universität München, Munich, Germany;Technische Universität München, Munich, Germany
Venue:
Proceedings of the 50th Annual Design Automation Conference
Year:
2013

Citing 4
Cited 0

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Abstract

With continued scaling of CMOS technology it becomes increasingly difficult to maintain reliable circuits. Early predictive technology and design exploration help to understand major effects of variability sources and their impact on circuit performances. With each new technology basic circuit blocks have to be redesigned to appropriately evaluate the impact of technology scaling. Therefore, this paper presents an approach which is able to find the optimal sizing of basic circuit blocks considering process variation. We utilize this approach to predict the impact of scaling in FinFET technologies and the influence of process variations in future technology nodes.