Search space reduction through clustering in test generation

Authors:
Zohair Sahraoui;Paul Six;Ivo Bolsens;Hugo De Man
Affiliations:
IMEC, Kapeldreef 75, Leuven, Belgium;IMEC, Kapeldreef 75, Leuven, Belgium;IMEC, Kapeldreef 75, Leuven, Belgium;Katholieke Universiteit Leuven and IMEC, Kapeldreef 75, Leuven, Belgium
Venue:
EURO-DAC '95/EURO-VHDL '95 Proceedings of the conference on European design automation
Year:
1995

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Abstract