Bridging defects resistance in the metal layer of a CMOS process

Differential Thermal Testing: An Approach to its Feasibility

Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop

Bridging Faults in Pipelined Circuits

Journal of Electronic Testing: Theory and Applications

Estimation of the defective IDDQ caused by shorts in deep-submicron CMOS ICs

Proceedings of the conference on Design, automation and test in Europe

Single Output Distributed Two-Rail Checker with Diagnosing Capabilities for Bus Based Self-Checking Architectures

Journal of Electronic Testing: Theory and Applications

CMOS Differential and Absolute Thermal Sensors

Journal of Electronic Testing: Theory and Applications

Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations

Journal of Electronic Testing: Theory and Applications

How Many Test Vectors We Need to Detect a Bridging Fault?

Journal of Electronic Testing: Theory and Applications