Logic design principles with emphasis on testable semicustom circuits
Logic design principles with emphasis on testable semicustom circuits
Shift Register Sequences
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
A programmable multiple-sequence generator for BIST applications
ATS '95 Proceedings of the 4th Asian Test Symposium
Hi-index | 14.98 |
A new multiple-sequence generator scheme to generate a set of deterministic ordered sequence of patterns followed by random patterns is presented in this paper. This scheme is based on an inverted nonlinear autonomous machine which utilizes a two-dimension-like LFSR with nonlinear inverters. A systematic procedure is also presented to obtain the autonomous machine which is more regular in the structure and utilizes less hardware. The generated deterministic sequence of patterns, which may have ordered and repeated patterns, and the random patterns are applicable to sequential circuit testing.