A programmable multiple-sequence generator for BIST applications

Authors:
Meng Lieh Sheu;Chung Len Lee
Affiliations:
-;-
Venue:
ATS '95 Proceedings of the 4th Asian Test Symposium
Year:
1995

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Abstract

In this paper, a programmable multiple-sequence generation scheme, which is constructed from a two-dimension-like feedback shift register structure, to generate a set of deterministic sequence of vectors followed by pseudo-random vectors is presented. A sequence segmentation method is employed to handle a long sequence of vectors. The proposed scheme has a regular structure, and the sequences so generated are more efficient in detecting faults for sequential circuit testing, stuck-open fault testing and delay fault testing. Hence, it is very suitable for the BIST application for MCM testing.