On computing optimized input probabilities for random tests
DAC '87 Proceedings of the 24th ACM/IEEE Design Automation Conference
An analytical approach to the partial scan problem
Journal of Electronic Testing: Theory and Applications
COMPACTEST: A Method to Generate Compact Test Sets for Combinatorial Circuits
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Minimal Test Sets for Combinatorial Circuits
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Test pattern generation hardware motivated by pseudo-exhaustive test techniques
EURO-DAC '94 Proceedings of the conference on European design automation
A Method for Designing a Deterministic Test Pattern Generator Based on Cellular Automata
Journal of Electronic Testing: Theory and Applications
A programmable multiple-sequence generator for BIST applications
ATS '95 Proceedings of the 4th Asian Test Symposium
Challenges and directions for testing IC
Integration, the VLSI Journal
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