Test pattern generation hardware motivated by pseudo-exhaustive test techniques

On computing optimized input probabilities for random tests

DAC '87 Proceedings of the 24th ACM/IEEE Design Automation Conference

A method for generating weighted random test pattern

IBM Journal of Research and Development

An analytical approach to the partial scan problem

Journal of Electronic Testing: Theory and Applications

Generation of deterministic test patterns by minimal basic test sets

EURO-DAC '92 Proceedings of the conference on European design automation

FPL Based Self-Test with Deterministic Test Patterns

Selected papers from the Second International Workshop on Field-Programmable Logic and Applications, Field-Programmable Gate Arrays: Architectures and Tools for Rapid Prototyping

Tools and devices supporting the pseudo-exhaustive test

EURO-DAC '90 Proceedings of the conference on European design automation