Computer - IEEE Centennial: the state of computing
Shift Register Sequences
Linear Feedback Shift Register Design Using Cyclic Codes
IEEE Transactions on Computers
Recursive Pseudoexhaustive Test Pattern Generation
IEEE Transactions on Computers
Arithmetic Additive Generators of Pseudo-Exhaustive Test Patterns
IEEE Transactions on Computers
Cellular Automata-Based Recursive Pseudoexhaustive Test Pattern Generator
IEEE Transactions on Computers
EDCC-3 Proceedings of the Third European Dependable Computing Conference on Dependable Computing
A programmable multiple-sequence generator for BIST applications
ATS '95 Proceedings of the 4th Asian Test Symposium
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The generation of exhaustive test patterns for VLSI circuits using linear feedback shift registers is described in terms of cyclic codes. Punctured cyclic codes are used to generate exhaustive test patterns of any length. A techniques for the generation of punctured cyclic codes is presented. A technique is also presented to reduce the size of test sets obtained from punctured cyclic codes.