Condensed Linear Feedback Shift Register (LFSR) Testing A Pseudoexhaustive Test Technique
IEEE Transactions on Computers - The MIT Press scientific computation series
Logic design principles with emphasis on testable semicustom circuits
Logic design principles with emphasis on testable semicustom circuits
Exhaustive Test Pattern Generation Using Cyclic Codes
IEEE Transactions on Computers
Recursive Pseudoexhaustive Test Pattern Generation
IEEE Transactions on Computers
Arithmetic Additive Generators of Pseudo-Exhaustive Test Patterns
IEEE Transactions on Computers
A partial image encryption method with pseudo random sequences
ICISS'06 Proceedings of the Second international conference on Information Systems Security
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A design technique is given for linear-feedback shift registers (LFSR) that generate test patterns for pseudoexhaustive testing of networks with restricted output dependency. This technique is based on cyclic code theory. Examples indicate that LFSRs based on cyclic codes are easier to implement and have lower hardware overhead than LFSRs that use other linear codes.