Hierarchical electromigration reliability diagnosis for VLSI interconnects

Authors:
Chin-Chi Teng;Yi-Kan Cheng;Elyse Rosenbaum;Sung-Mo Kang
Affiliations:
Coordinated Science Lab. and Dept. of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, Urbana, IL;Coordinated Science Lab. and Dept. of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, Urbana, IL;Coordinated Science Lab. and Dept. of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, Urbana, IL;Coordinated Science Lab. and Dept. of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, Urbana, IL
Venue:
DAC '96 Proceedings of the 33rd annual Design Automation Conference
Year:
1996

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