Extreme delay sensitivity and the worst-case switching activity in VLSI circuits

  • Authors:
  • Farid N. Najm;Michael Y. Zhang

  • Affiliations:
  • ECE Dept. and Coordinated Science Lab., University of Illinois at Urbana-Champaign, Urbana, IL;ECE Dept. and Coordinated Science Lab., University of Illinois at Urbana-Champaign, Urbana, IL

  • Venue:
  • DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
  • Year:
  • 1995

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Abstract