Testing for Bounded Faults in RAMs

Authors:
R. David;J. A. Brzozowski;H. Jürgensen
Affiliations:
Laboratoire d‘Automatique de Grenoble, INPG-CNRS, 38402 Saint-Martin-d‘Hères, France. E-mail: david@lag.grenet.fr;Department of Computer Science, University of Waterloo, Waterloo, ON, Canada N2L 3G1. E-mail: brzozo@maverico.uwaterloo.ca;Department of Computer Science, The University of Western Ontario, London, ON, Canada N6A 5B7. E-mail: helmut@uwo.ca
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
1997

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Abstract

We study the class of “bounded faults” in random-access memories;these are faults that involve a bounded number of cells. This is avery general class of memory faults that includes, for example, theusual stuck-at, coupling, and pattern-sensitive faults, but also manyother types of faults. Some bounded faults are known to requiredeterministic tests of length proportional to n log2 n, where nis the total number of memory cells. The main result of this paper isthat, for any bounded fault satisfying certain very mild conditions,the random test length required for a given level of confidence isalways O(n).