Testing for Bounded Faults in RAMs
Journal of Electronic Testing: Theory and Applications
Design of Cache Test Hardware on the HP PA8500
IEEE Design & Test
DESIGN OF CACHE TEST HARDWARE ON THE HP PA8500
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Automatic Generation of Diagnostic Memory Tests Based on Fault Decomposition and Output Tracing
IEEE Transactions on Computers
Generating march tests automatically
ITC'94 Proceedings of the 1994 international conference on Test
Hi-index | 0.00 |