Generating march tests automatically

Authors:
A. J. van de Goor;B. Smit
Affiliations:
Department of Electrical Engineering, Delft University of Technology, Delft, The Netherlands;Department of Electrical Engineering, Delft University of Technology, Delft, The Netherlands
Venue:
ITC'94 Proceedings of the 1994 international conference on Test
Year:
1994

Citing 7
Cited 1

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A new framework for generating optimal March tests for memory arrays

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Abstract

Many memory tests have been designed in the past, one class of tests which has been proven to be very efficient in terms of fault coverage as well as test time, is the class of march tests. Designing march tests is a tedious, manual task. This paper presents a method which can, given a set of fault models, automatically generate the required march tests. It has been implemented in the programming language C and shown to be effective.