Testing for Bounded Faults in RAMs
Journal of Electronic Testing: Theory and Applications
Testing C-elements is not elementary
ASYNC '95 Proceedings of the 2nd Working Conference on Asynchronous Design Methodologies
Verification of CAM Tests for Input Stuck-at Faults
MTDT '98 Proceedings of the 1998 IEEE International Workshop on Memory Technology, Design and Testing
18.3 An Approach to Modeling and Testing Memories and Its Application to CAMs
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Automatic Generation of Diagnostic Memory Tests Based on Fault Decomposition and Output Tracing
IEEE Transactions on Computers
Information and Computation
Generating march tests automatically
ITC'94 Proceedings of the 1994 international conference on Test
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