On-chip test generation for combinational circuits by LFSR modification

Authors:
Shambhu J. Upadhyaya;Liang-Chi Chen
Affiliations:
Dept. of Electrical and Computer Engineering, State University of New York at Buffalo, Buffalo, New York;Dept. of Electrical and Computer Engineering, State University of New York at Buffalo, Buffalo, New York
Venue:
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Year:
1993

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Abstract