A Gauss-elimination based PRPG for combinational circuits

Authors:
Li-Ren Huang;Sy-Yen Kuo;Ing-Yi Chen
Affiliations:
Department of Electrical Engineering, National Taiwan University, Taipei, Taiwan, R.O.C.;Department of Electrical Engineering, National Taiwan University, Taipei, Taiwan, R.O.C.;Department of Electronic Engineering, Chung Yuan Christian University, Chungli, Taiwan, R.O.C.
Venue:
EDTC '95 Proceedings of the 1995 European conference on Design and Test
Year:
1995

Citing 4
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Abstract

A new algorithm for the reseeding of multiple polynomial LFSR for pseudorandom test pattern generation (PRPG) is proposed in this paper. It is based on the Gauss-elimination procedure and the deterministic test set generated by an ATPG software system for combinational circuits. In addition to the general LFSR model, we also provide two further improvements, ms1p and 1smp, to minimize the hardware overhead. Experimental results were obtained on ISCAS-85 benchmark circuits to demonstrate the effectiveness of this methodology. Complete fault coverage is achieved in all circuits. Low hardware overhead is also maintained with a reasonable test length.