Logic partitioning to pseudo-exhaustive test for BIST design

• Authors:

• Chien-In Henry Chen;Joel Yuen

• Affiliations:

• Department of Electrical Engineering, Wright State University, Dayton, OH;Department of Electrical Engineering, Wright State University, Dayton, OH

• Venue:
• ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
• Year:
• 1993