Partitioning circuits for inproved testability
Proceedings of the fourth MIT conference on Advanced research in VLSI
A coordinated approach to partitioning and test pattern generation for pseudoexhaustive testing
DAC '89 Proceedings of the 26th ACM/IEEE Design Automation Conference
Tools and devices supporting the pseudo-exhaustive test
EURO-DAC '90 Proceedings of the conference on European design automation
Graph Theory with Applications to Engineering and Computer Science (Prentice Hall Series in Automatic Computation)
DFBT: a design-for-testability method based on balance testing
DAC '94 Proceedings of the 31st annual Design Automation Conference
Area efficient pipelined pseudo-exhaustive testing with retiming
DAC '96 Proceedings of the 33rd annual Design Automation Conference
Logic partitioning to pseudo-exhaustive test for BIST design
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Novel Test Pattern Generators for Pseudoexhaustive Testing
IEEE Transactions on Computers
A tree-structured LFSR synthesis scheme for pseudo-exhaustive testing of VLSI circuits
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Accurate Reliability Evaluation and Enhancement via Probabilistic Transfer Matrices
Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Design and design automation of rectification logic for engineering change
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
Probabilistic transfer matrices in symbolic reliability analysis of logic circuits
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Bounds on pseudoexhaustive test lengths
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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