Area efficient pipelined pseudo-exhaustive testing with retiming

Authors:
Huoy-Yu Liou;Ting-Ting Y. Lin
Affiliations:
Tandem Computers Inc., Cupertino, CA and Department of Electrical and Computer Engineering, University of California, San Diego;Department of Electrical and Computer Engineering, University of California, San Diego
Venue:
DAC '96 Proceedings of the 33rd annual Design Automation Conference
Year:
1996

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