The Ballast Methodology for Structured Partial Scan Design
IEEE Transactions on Computers
A Partial Scan Method for Sequential Circuits with Feedback
IEEE Transactions on Computers
Introduction to algorithms
An analytical approach to the partial scan problem
Journal of Electronic Testing: Theory and Applications
DAC '90 Proceedings of the 27th ACM/IEEE Design Automation Conference
Computers and Intractability: A Guide to the Theory of NP-Completeness
Computers and Intractability: A Guide to the Theory of NP-Completeness
HITEC: a test generation package for sequential circuits
EURO-DAC '91 Proceedings of the conference on European design automation
Resynthesis and retiming for optimum partial scan
DAC '94 Proceedings of the 31st annual Design Automation Conference
Partial scan with pre-selected scan signals
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
Layout driven selecting and chaining of partial scan flip-flops
DAC '96 Proceedings of the 33rd annual Design Automation Conference
Area efficient pipelined pseudo-exhaustive testing with retiming
DAC '96 Proceedings of the 33rd annual Design Automation Conference
Synthesis of Sequential Circuits by Redundancy Removal and Retiming
Journal of Electronic Testing: Theory and Applications - Special issue on test synthesis
Layout Driven Selection and Chaining of Partial Scan Flip-Flops
Journal of Electronic Testing: Theory and Applications
Partial Scan with Preselected Scan Signals
IEEE Transactions on Computers
A New Class of Sequential Circuits with Combinational Test Generation Complexity
IEEE Transactions on Computers
Test sequence compaction by reduced scan shift and retiming
ATS '95 Proceedings of the 4th Asian Test Symposium
Retiming with logic duplication transformation: theory and an application to partial scan
VLSID '96 Proceedings of the 9th International Conference on VLSI Design: VLSI in Mobile Communication
Synthesis for Testability by Sequential Redundancy Removal Using Retiming
FTCS '95 Proceedings of the Twenty-Fifth International Symposium on Fault-Tolerant Computing
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