Combinatorial optimization: algorithms and complexity
Combinatorial optimization: algorithms and complexity
A Partial Scan Method for Sequential Circuits with Feedback
IEEE Transactions on Computers
DAC '93 Proceedings of the 30th international Design Automation Conference
A cost-based approach to partial scan
DAC '93 Proceedings of the 30th international Design Automation Conference
Computers and Intractability: A Guide to the Theory of NP-Completeness
Computers and Intractability: A Guide to the Theory of NP-Completeness
Designing Circuits with Partial Scan
IEEE Design & Test
A new approach to scan chain reordering using physical design information
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A layout-based approach for ordering scan chain flip-flops
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Layout-Driven SOC Test Architecture Design for Test Time and Wire Length Minimization
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
A routability constrained scan chain ordering technique for test power reduction
ASP-DAC '06 Proceedings of the 2006 Asia and South Pacific Design Automation Conference
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