Bounds on pseudoexhaustive test lengths

Authors:
Rajagopalan Srinivasan;Sandeep K. Gupta;Melvin A. Breuer
Affiliations:
Engineering Research Center of Lucent Technologies Bell Laboratories, Princeton, NJ;Department of Electrical Engineering-Systems, University of Southern California, Los Angeles, CA;Department of Electrical Engineering-Systems, University of Southern California, Los Angeles, CA
Venue:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Year:
1998

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Abstract

Pseudoexhaustive testing involves applying all possible input patterns to the individual output cones of a combinational circuit. Based on our new algebraic results, we have derived both generic (cone-independent) and circuit-specific (conedependent) bounds on the minimal length of a test required so that each cone in a circuit is exhaustively tested. For any circuit with five or fewer outputs, and where each output has k or fewer inputs, we show that the circuit can always be pseudoexhaustively tested with just 2k patterns. We derive a tight upper bound on pseudoexhaustive test length for a given circuit by utilizing the knowledge of the structure of the circuit output cones. Since our circuit-specific bound is sensitive to the ordering of the circuit inputs, we show how the bound can be improved by permuting these inputs.