Novel Test Pattern Generators for Pseudo-Exhaustive Testing

Novel Test Pattern Generators for Pseudoexhaustive Testing

IEEE Transactions on Computers

Testing Schemes for FIR Filter Structures

IEEE Transactions on Computers

A tree-structured LFSR synthesis scheme for pseudo-exhaustive testing of VLSI circuits

ITC '98 Proceedings of the 1998 IEEE International Test Conference

Multiple-Seed TPG Structures

IEEE Transactions on Computers

Challenges and directions for testing IC

Integration, the VLSI Journal

Goal-directed vector generation using sample ICs

ITC'94 Proceedings of the 1994 international conference on Test

Bounds on pseudoexhaustive test lengths

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Path sensitization and sub-circuit partition of CUT using t,-distribution for pseudo-exhaustive testing

AsiaSim'04 Proceedings of the Third Asian simulation conference on Systems Modeling and Simulation: theory and applications