Path sensitization and sub-circuit partition of CUT using t,-distribution for pseudo-exhaustive testing

Authors:
Jin Soo Noh;Chang Gyun Park;Kang-Hyeon Rhee
Affiliations:
Dept. of Electronic Eng., Multimedia & Biometrics Lab, Chosun University, Gwangju Metropolitan city, (Daehanminkook), Korea;Dept. of Electronic Eng., Multimedia & Biometrics Lab, Chosun University, Gwangju Metropolitan city, (Daehanminkook), Korea;Dept. of Electronic Eng., Multimedia & Biometrics Lab, Chosun University, Gwangju Metropolitan city, (Daehanminkook), Korea
Venue:
AsiaSim'04 Proceedings of the Third Asian simulation conference on Systems Modeling and Simulation: theory and applications
Year:
2004

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Abstract

This paper presents a new pseudo-exhaustive testing algorithm that is composed of the path sensitization and sub-circuit partitioning using t-distribution. In the proposed testing algorithm, the paths, for the path sensitization the, between PIs and POs based on the high TMY(test-mainstay) nodes of CUT(circuit under test) are sensitized and the boundary nodes, for the partitioned sub-circuits, are defined on the level of significance α on t-distribution respectively. As a consequence, when (1-α) is 0.2368, the most suitable of the performance to operate the singular cover and consistency operation in the path sensitization. And when α is 0.5217, the most suitable of the performance to partition the sub-circuit in sub-circuit partitioning.