A Self-Testing Nonincreasing Order Checker

  • Authors:
  • D. L. Tao

  • Affiliations:
  • State Univ. of New York at Stony Brook, Stony Brook, NY

  • Venue:
  • IEEE Transactions on Computers
  • Year:
  • 1997

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Abstract

In this paper, we design a new class of self-testing checkers, self-testing nonincreasing order checkers, for the first time. The self-testing nonincreasing order checker is a critical component to design concurrent checking VLSI sorters because it is capable of checking whether an arbitrary long sequence of numbers has been sorted, as well as testing itself during normal system operation.