Configuring multiple scan chains for minimum test time
ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
Selectable Length Partial Scan: A Method to Reduce Vector Length
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Optimal Sequencing of Scan Registers
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
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