Acceleration techniques for dynamic vector compaction
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
Reconfigurable scan chains: a novel approach to reduce test application time
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Algorithms to compute bridging fault coverage of IDDQ test sets
ACM Transactions on Design Automation of Electronic Systems (TODAES)
A linear optimal test generation algorithm for interconnect testing
Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design
Configuring multiple scan chains for minimum test time
ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
An algorithm to reduce test application time in full scan designs
ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
Static Test Compaction for Scan-Based Designs to Reduce Test Application Time
Journal of Electronic Testing: Theory and Applications - Special Issue on the 7th ASIAN TEST SYMPOSIUM, ATS-98
Random limited-scan to improve random pattern testing of scan circuits
Proceedings of the 38th annual Design Automation Conference
Optimal Configuring of Multiple Scan Chains
IEEE Transactions on Computers
Test sequence compaction by reduced scan shift and retiming
ATS '95 Proceedings of the 4th Asian Test Symposium
A genetic approach to test application time reduction for full scan and partial scan circuits
VLSID '95 Proceedings of the 8th International Conference on VLSI Design
Dynamic test Sequence compaction for Sequential Circuits
VLSID '96 Proceedings of the 9th International Conference on VLSI Design: VLSI in Mobile Communication
ITC '01 Proceedings of the 2001 IEEE International Test Conference
A New Approach to Test Generation and Test Compaction for Scan Circuits
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Test compaction for transition faults under transparent-scan
Proceedings of the conference on Design, automation and test in Europe: Proceedings
ATPG for heat dissipation minimization during test application
ITC'94 Proceedings of the 1994 international conference on Test
Reduced scan shift: a new testing method for sequential circuits
ITC'94 Proceedings of the 1994 international conference on Test
Autoscan: a scan design without external scan inputs or outputs
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
| Hi-index | 0.01 |