Reconfigurable scan chains: a novel approach to reduce test application time

Authors:
Sridhar Narayanan;Melvin A. Breuer
Affiliations:
Department of Electrical Engineering-Systems, University of Southern California, Los Angeles, CA;Department of Electrical Engineering-Systems, University of Southern California, Los Angeles, CA
Venue:
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Year:
1993

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