Overall consideration of scan design and test generation
ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
An algorithm to reduce test application time in full scan designs
ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
Proptest: a property based test pattern generator for sequential circuits using test compaction
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
An approach to test compaction for scan circuits that enhances at-speed testing
Proceedings of the 38th annual Design Automation Conference
Reduced Scan Shift: A New Testing Method for Sequential Circuit
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
IDDQ and AC Scan: The War Against Unmodelled Defects
Proceedings of the IEEE International Test Conference on Test and Design Validity
Selectable Length Partial Scan: A Method to Reduce Vector Length
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
A Serial-Scan Test-Vector-Compression Methodology
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Static Test Compaction for Scan-Based Designs to Reduce Test Application Time
ATS '98 Proceedings of the 7th Asian Test Symposium
Sequential Circuit Test Generation Using Dynamic State Traversal
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Vector restoration based static compaction of test sequences for synchronous sequential circuits
ICCD '97 Proceedings of the 1997 International Conference on Computer Design (ICCD '97)
Test application time reduction for sequential circuits with scan
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Effective diagnostic pattern generation strategy for transition-delay faults in full-scan SOCs
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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Functional test sequences were shown to detect unique defects in VLSI circuits. This is thought to be due to the fact that they are applied at-speed. However, functional test sequences do not achieve complete stuck-at fault coverage. Therefore, scan-based stuck-at tests, as well as other types of tests, are typically also applied. This increases the amount of test resources required for test application. We describe a procedure for inserting (limited) scan operations into a functional sequence in order to improve its stuck-at fault coverage, thus reducing or eliminating the need for separate scan-based stuck-at tests. Between scan operations, the functional test sequence can still be applied at-speed; however, a higher stuck-at fault coverage is achieved.