Static Test Compaction for Scan-Based Designs to Reduce Test Application Time
Journal of Electronic Testing: Theory and Applications - Special Issue on the 7th ASIAN TEST SYMPOSIUM, ATS-98
Random limited-scan to improve random pattern testing of scan circuits
Proceedings of the 38th annual Design Automation Conference
Generating efficient tests for continuous scan
Proceedings of the 38th annual Design Automation Conference
Test application time and volume compression through seed overlapping
Proceedings of the 40th annual Design Automation Conference
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Fast and energy-frugal deterministic test through efficient compression and compaction techniques
Journal of Systems Architecture: the EUROMICRO Journal - Special issue: Desing and test of systems on a chip
Virtual Compression through Test Vector Stitching for Scan Based Designs
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
A New Approach to Test Generation and Test Compaction for Scan Circuits
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Test compaction for transition faults under transparent-scan
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Reduced scan shift: a new testing method for sequential circuits
ITC'94 Proceedings of the 1994 international conference on Test
Autoscan: a scan design without external scan inputs or outputs
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
COMPAS – compressed test pattern sequencer for scan based circuits
EDCC'05 Proceedings of the 5th European conference on Dependable Computing
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