Overall consideration of scan design and test generation

Authors:
Pao-Chuan Chen;Bin-Da Liu;Jhing-Fa Wang
Affiliations:
Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan 70101, R.O.C.;Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan 70101, R.O.C.;Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan 70101, R.O.C.
Venue:
ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
Year:
1992

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