Diffeomorphisms Groups and Pattern Matching in Image Analysis

Authors:
Alain Trouvé
Affiliations:
LAGA, Institut Galilée, Université Paris13, Av J-B Clément, 93430 Villetaneuse, France. E-mail: trouve@math.univ-paris13.fr
Venue:
International Journal of Computer Vision
Year:
1998

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Abstract

In a previous paper, it was proposed to see thedeformations of a common pattern as the action of an infinitedimensional group. We show in this paper that this approach canbe applied numerically for pattern matching in image analysis ofdigital images. Using Lie group ideas, we construct a distancebetween deformations defined through a metric given the cost ofinfinitesimal deformations. Then we propose a numerical schemeto solve a variational problem involving this distance andleading to a sub-optimal gradient pattern matching. Its linkswith fluid models are established.