Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach

Authors:
Chris Feige;Jan Ten Pierick;Clemens Wouters;Ronald Tangelder;Hans G. Kerkhoff
Affiliations:
Philips Semiconductors, Business Line Cellular, Gerstweg 2, 6534 AE Nijmegen, The Netherlands. Chris.Feige@nym.sc.philips.com;Philips Semiconductors, Business Line Cellular, Gerstweg 2, 6534 AE Nijmegen, The Netherlands;Philips Semiconductors, ASIC Service Group, Prof. Holstlaan 4, 5656 AA Eindhoven, The Netherlands;University of Twente, MESA Research Institute, P.O. Box 217, 7500 AE Enschede, The Netherlands;University of Twente, MESA Research Institute, P.O. Box 217, 7500 AE Enschede, The Netherlands
Venue:
Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop
Year:
1999

Citing 1
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Abstract

This paper describes a test method for analogue (partsof) ICs that determines whether an IC is good or not bymeasuring the currents flowing through its constituent circuits.The ICCQ test method is not a full functional test. Itis aimed primarily ...