Metrics and Criteria for Quality Assessment of Testable Hw/Sw Systems Architectures

  • Authors:
  • Octávio P. Dias;Isabel C. Teixeira;J. Paulo Teixeira

  • Affiliations:
  • Escola Superior de Tecnologia, Instituto Politécnico de Setúbal, Rua Vale de Chaves, Estefanilha, 2900 Setúbal, Portugal. pdias@bocage.ips.pt;Instituto Superior Técnico, Universidade Técnica de Lisboa, Instituto de Engenharia de Sistemas e Computadores, Apartado 13 069, 1017 Lisboa Codex, Portugal. ict@zeppelin.inesc.pt;Instituto Superior Técnico, Universidade Técnica de Lisboa, Instituto de Engenharia de Sistemas e Computadores, Apartado 13 069, 1017 Lisboa Codex, Portugal. jct@zeppelin.inesc.pt

  • Venue:
  • Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop
  • Year:
  • 1999

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Abstract

The purpose of this paper is to present a novel methodology forassessing the quality of architecture solutions of hw/sw systems, with particular emphasis on testability. Criteria and metricsfor quality assessment are proposed and used to assist the design team in selecting a ‘best-fitted’ architecture thatsatisfies not only functional requirements, but also test requirements. Themethodology makes use of object-oriented modeling techniques. Near-optimum clustering of methods and attributes into objects is carried out, in such a way that objects with moderate complexity, low coupling and high functional autonomy, result. The main features of the methodology are ascertained through a case study.