Survey of Low-Power Testing of VLSI Circuits
IEEE Design & Test
Low Power Testing of VLSI Circuits: Problems and Solutions
ISQED '00 Proceedings of the 1st International Symposium on Quality of Electronic Design
The design of high-performance dynamic asynchronous pipelines: lookahead style
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
| Hi-index | 0.09 |
Designers of 100-million-transistor chips face daunting challenges, most especially in dealing with switching currents, optimization, asynchronization, reuse, and design skills. Certain subjects-interconnections, for example-will prove to cut across all five topics. All the same, the issues offer a useful view on what designers will face in handling these complexities. These five topics are discussed in the paper