CAD for RF circuits

  • Authors:
  • P. Wambacq;G. Vandersteen;J. Phillips;J. Roychowdhury;W. Eberle;B. Yang;D. Long;A. Demir

  • Affiliations:
  • IMEC, Heverlee, Belgium;IMEC, Heverlee, Belgium;Cadence Berkeley Laboratories;Bell Laboratories, Murray Hill, New Jersey;IMEC, Heverlee, Belgium;Cadence Design Systems, Inc.;Bell Laboratories, Murray Hill, New Jersey;Bell Laboratories, Murray Hill, New Jersey

  • Venue:
  • Proceedings of the conference on Design, automation and test in Europe
  • Year:
  • 2001

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Abstract